Review—Electrochemical Migration in Electronic Materials: Factors Affecting the Mechanism and Recent Strategies for Inhibition

Electrochemical migration (ECM) is one of the serious failure modes encountered in electronic devices due to electrochemical reactions triggered by presence moisture and bias voltage, leading growth dendrites short circuits. The classical ECM mechanism consists four consecutive stages: (i) electrolyte formation, (ii) anodic dissolution, (iii) ion transport, (iv) dendrite growth. a delicate process that involves combination good number factors, such as electrode properties, climatic conditions, contaminants, electric field, additives, etc. We intend provide comprehensive review complex effects these factors have on each stage insights into recent developments research. Previous findings, current debates discoveries are covered this article. This paper also provides strategies for ameliorating failures electronics.